Probe Card
Jenoptik Optical Systems LLC, Advanced Photonic SolutionsRequest Info
JENA, Germany, Oct. 4, 2023, — 
The UFO Probe® Vertical from Jenoptik is a probe card made for testing photonic integrated circuits (PICs) at wafer level. The probe card enables parallel functional tests of optical and electrical components on chips using vertical needle technology allowing the user to couple up to 32 optical channels in parallel without active alignment. The chip covers wavelengths from 1260 to 1625 nm and up to 6000 bond pads with dimensions down to 35 μm can be contacted.
https://www.jenoptik.com
https://www.photonics.com/Buyers_Guide/Jenoptik_Optical_Systems_LLC_Advanced_Photonic/c31639
Photonics.com
Oct 2023
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:
When you click "Send Request", we will record and send your personal contact information to Jenoptik Optical Systems LLC, Advanced Photonic Solutions by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our
Privacy Policy and
Terms and Conditions of Use.
Register or login to auto-populate this form:
Login
Register
* Required