All Documents
Mon, Sep 25, 2023A Practical Guide to Machine Vision Lighting, Second Edition
Proper illumination is paramount to a successful machine vision system. A Practical Guide to Machine Vision Lighting (Second Edition) by Daryl Martin outlines the fundamentals – enabling you to create high contrast images when wanted and accentuate features of interest when needed. Whether you're a...
Advanced illumination (Ai)
Thu, Sep 21, 2023Characterization of SERRS Nanoparticles Using UV-Vis and Raman Spectroscopy
Surface-enhanced resonance Raman scattering (SERRS) is a technique that offers unparalleled sensitivity and specificity in nondestructive spectroscopic detection. It combines surface-enhanced Raman scattering (SERS) and resonance Raman spectroscopy (RRS), two techniques that are individually used...
Edinburgh Instruments Ltd.
Thu, Sep 14, 2023Phase Detection with Lock-in Amplifier and Phasemeter
Precise and sensitive phase detections are often required for impedance and optics-based measurements. For example, measuring the phase shift between current and voltage reveals the complex impedance of a device or component. Very small displacements can be measured by the phase shift between...
Liquid Instruments
Mon, Aug 21, 2023Extend Into DeepUV™ for Analysis Instrumentation at a Reasonable Cost
A revolutionary and proprietary way to manufacture highly efficient DUV Gratings for High Volume — at a reasonable cost. New non-etched fused silica gratings from 190 to 400 nm.
Optometrics Corp.
Fri, Aug 18, 2023Principles of Lock-in Detection
Explore the world of lock-in amplifiers in this paper, vital for success in photonics labs. Grasp the details of detecting amplitude and phase amid widespread signal changes from pulsed lasers, acousto- and electro-optic modulators, optical choppers, and other devices. Delve into essential...
Zurich Instruments AG
Wed, Aug 16, 2023Multiband Optical Filters Are Telecom Networks' Multitaskers
The ability to combine more than one spectral band into a single optical filter can enable flexibility of system design and reduce the number of components and the costs needed to achieve a desired functionality in fiber optic telecom components. Recent advances in multiband and multifunction...
Iridian Spectral Technologies
Mon, Aug 7, 2023What Is the Modulation Transfer Function?
The modulation transfer function, or MTF, is a parameter used to evaluate the performance of a lens. MTF provides a quantitative and standardized way to characterize optical systems, so the metric is used by optical designers and microscopists alike to compare lenses and determine the ideal one for...
Evident Scientific Inc.
Wed, Jul 19, 2023Case Study: Customer Target Ensures Confidence in Measurement & Inspection Accuracy
Objective: Produce an Advanced Defect-free Continuous Glucose Monitor (CGM). This study shows how a leading assembly and automation equipment integrator used a custom checkerboard target to develop a machine used to assemble a CGM transmitter. The chrome and clear glass target met the requirements...
Applied Image Inc.
Thu, Jul 13, 2023Maximize Control: Unlocking Efficiency with PID Controllers
Our white paper on PID controllers delves into key topics such as control strategies, system performance, and tuning methods. It provides practical insights and guidance to help readers solve control-related problems and gain a deeper understanding of PID controller principles. Whether you're a...
Zurich Instruments AG
Mon, Jul 3, 2023Resonant Probe AFM: Uses and Advantages
A resonant probe atomic force microscope (AFM) offers capabilities and benefits not found in commonly used optical deflection AFMs in the measurement of physical constants, physical properties, and surface morphology. This article discusses resonant probe AFM construction, functionality. Some of...
Mad City Labs Inc.
Mon, Jul 3, 2023Polarization Metrology of Anisotropic Materials
Full Mueller matrix measurements allow for elimination of ambiguity and a fuller understanding of polarization metrology. The Exicor 150XT system offers complete Mueller matrix measurement from 350 nm to 800 nm with automated sample translation and optional tip-tilt measurements. Integration times...
Hinds Instruments Inc.