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SPIE Optifab 2023

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October 16, 2023 - October 19, 2023
Joseph A. Floreano Riverside Convention Center
Rochester, NY, United States
SPIE
+1 360-676-3290

About this Event
SPIE Optifab is the premier event to meet with top companies and learn about the latest optical fabrication technologies. Organized jointly by SPIE and APOMA, Optifab is the largest optical manufacturing conference and exhibition held in North America.

The conference, with co-chairs Jessica DeGroote Nelson of Edmund Optics and Blair Unger of N2 Imaging Systems, LLC., will focus on the latest in optical fabrication technologies and will feature expert-led presentations. Attendees will also be able to attend a multiday industry exhibition and courses.

This year’s conference comprises 12 sessions, including novel approaches to optical fabrication and testing, materials and thin films, finishing methods, materials for high position optics, off axis and freeform optics, and more. A poster session is also included in this year’s program.

The conference’s optical fabrication exhibition will showcase more than 180 companies from around the world and offer in-person opportunities to meet and explore companies exhibiting their latest products and innovations. Featured technologies at the exhibition include optical fabrication equipment; optical components, materials, and systems; optomechanical components and devices; laser system components; optical thin-film coatings; optical metrology and testing equipment; cleanroom equipment; and software, adhesives, glass, and consumables.




SPIE Optifab 2023 Products
Non-Contact Thickness Measurement Bristol Instruments Inc.
Booth: 607
Optimize Your Lens Production TRIOPTICS GmbH, Member of the Jenoptik Group
Booth: 1221
SK-1300 Fused Silica Ohara Corporation, Western Office
Booth: 706

Auto Centering Machine with Robot Mildex Inc.
Booth: 613
SPS-200 Polisher Satisloh GmbH
Booth: 521
Picometer Roughness Measurements Nanosurf AG
Booth: 1110


SPIE Optifab 2023opticsAmericasthin-film coatingsoptical componentsTest & Measurement
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