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Photonics Buyers' Guide / Cameras & Imaging / Scanning Probe Microscopes
Additional Companies

Market Data for Companies in This Category
Countries
8
United States:
3
Germany:
1
Israel:
1
Canada:
1
United Kingdom:
OTHER: 1
US States
3
California:
1
Arizona:
1
Wisconsin:
1
Pennsylvania:
1
Indiana:
OTHER: 8
Capabilities
9
Stock Manufacturers:
7
Suppliers/Distributors:
4
Custom Manufacturers:
1
Designer:
Average Number of Employees: 82


The Photonics Buyers' Guide is a comprehensive resource for verified providers of Scanning Probe Microscopes. Profiles and contact information for manufacturers and suppliers are provided by the companies and verified by our editors. If you have updated information about any of the organizations listed, please contact us.
Glossary
  • scanning probe microscope See atomic force microscope; magnetic force microscope; near-field scanning optical microscope; scanning tunneling microscope.
  • atomic force microscope (AFM) A type of microscope that produces a quantitative, three-dimensional image of the surface of a sample. The surface is scanned by an extremely sharp tip mounted to a flexible cantilever. The atoms on the tip interact with the atoms on the surface of...
  • magnetic force microscope A variation of the atomic force microscope that operates by scanning a tiny ferromagnetic probe (or a magnetized tip) over a magnetic sample, and detecting the extremely small forces exerted on the probe by the sample's stray magnetic fields. The...
  • near-field scanning optical microscope (NSOM) A scanning probe microscope that analyzes the surface of a specimen by recording the intensity of light as it is focused through a pipette and raster scanned across the specimen at a distance less than a wavelength. The resolution and high contrast...
atomic force microscope3-D image3D imagescanningferromagnetic probemagnetic fieldslight intensityspecimen surfaceresearch equipmentimaging instrumentfine conductive proberamanmicro scopemicroscopytest & measurement
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